Expanding our Inspection Capabilities

The FRT CWL sensor used in the MicroProf® makes use of the chromatic aberration (in principle the wavelength – dependent refractive index) of optical lenses.

A passive lens with larger chromatic aberration fans out the white light vertically in different colored focal points and consequently the height. By meeting a surface the focused light, in contrast to the unfocused components of the beam, will be optimally reflected. White light is focused on the surface by a measuring head with a strongly wavelength-dependent focal length. The spectrum of the light reflected on the surface generates a peak in the spectrometer. The wavelength of this peak is used to determine the distance to the sample surface.

This scanner can provide non-destructive investigation of topography, 2D and 3D profiles, volume loss and/or gain calculations, and surface parameter measurements. 

For more information about our scanning capabilities, please contact us here.

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