Expanding our Inspection Capabilities

frt machine showing surface topography

The FRT CWL sensor used in the MicroProf® makes use of the chromatic aberration (in principle the wavelength – dependent refractive index) of optical lenses.

A passive lens with larger chromatic aberration fans out the white light vertically in different colored focal points and consequently the height. By meeting a surface the focused light, in contrast to the unfocused components of the beam, will be optimally reflected. White light is focused on the surface by a measuring head with a strongly wavelength-dependent focal length. The spectrum of the light reflected on the surface generates a peak in the spectrometer. The wavelength of this peak is used to determine the distance to the sample surface.

This scanner can provide non-destructive investigation of topography, 2D and 3D profiles, volume loss and/or gain calculations, and surface parameter measurements. 

For more information about our scanning capabilities, please contact us here.

About The Author

Innovative Test Solutions, Inc. (ITS)

Innovative Test Solutions, Inc. (ITS) was founded in 2004 and is a full-service and ISO/IEC 17025 mechanical engineering and accredited testing laboratory based in Schenectady, New York. Our team of engineers come from all disciplines and bring years of experience and insight, making them leaders in the industry. Services range from standard ASTM test protocols such as thermal barrier coatings, vibration, fatigue, fracture mechanics, and friction and wear testing to developing custom test rigs to meet the needs of our clients. Industries serviced by ITS include power generation, gas and oil, defense, aerospace, transportation, and biomedical systems.
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